Performance Testing of Logarithmic Analog- To-digital Converters

Abstract This paper describes test procedures to characterize the behavior of logarithmic analog-to-digital converters. Logarithmic A/D converters are usually characterized in terms of signal-to-noise ratio (SNR) or in deviation of the ideal characteristic in dB. There are a lack of test methods definition in the literature, as can be observed in the IEEE standard 1241 for these type of converters. Systematic test procedures have been applied to μ-law converters according to the G.711 standard, and to a new type of high-speed true logarithmic pipeline A/D converter. DNL and INL had been defined in the logarithmic domain to allow correct characterization of this class of converters.